Manufacturing of graphene and its composites
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Our Methods
Welcome to M-GRAFE Methods
X-ray photoelectron spectroscopy (XPS) is a surface analysis technique that measures the elemental composition and chemical state of a material using the feedback from an induced photoelectron effect. It is sometimes known by the alternative name Electron Spectroscopy for Chemical Analysis (ESCA). It is used in graphene to analyze the element composition & the surface chemistry of both graphite (raw material) and graphene.
SEM is an imaging technique that uses incident electrons to generate secondary sample irradiance. This can then be analyses to visualize sample surfaces with high depth of field and lateral resolutions of around 1-20nm, as well as analyses the physical and chemical state of the substrate.
Raman spectroscopy is a non-invasive optical technique used to determine the chemical identity and state of a sample by its unique vibrational (molecular) modes. Inelastic (loss or gain of energy) scattering of light from the sample is measured, with distinct shifts in the energy of the scattered photons being represented. In graphene it is used to infer the graphene layers and degree of defects & impurities.
TEM is a microscopy technique capable of providing very high resolution images down to a level of several Angstroms (~ 0.19nm). It images thin samples via the interaction of electrons as they pass through a specimen. Detecting a range of resultant secondary signals allows for the study of nano-scale morphological and chemical features of materials down to near atomic levels.
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